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International Journal of Engineering، جلد ۲۹، شماره ۹، صفحات ۱۲۴۷-۱۲۵۶
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عنوان انگلیسی Look up Table Based Low Power Analog Circuit Testing
چکیده انگلیسی مقاله In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the analog circuit, is designed and is taken for testing purpose. Fault coverage is identified after fault modeling, fault injection and fault simulation. More than 93% fault coverage is achieved and there is a scope of increasing more fault coverage. Since analog testing prefaces the challenge of power dissipation during testing, some power minimization techniques like sleepy stack method and current correlation method have adhered during the testing process. Test power reduction up to 84 % is achieved in this work.
کلیدواژه‌های انگلیسی مقاله
نویسندگان مقاله Laxmana Maharana |
ECE, National Institute of Technology, Agartala

Trupa Sarkar |
ECE, National Institute of technology, Agartala

Sambhu Pradhan |
ECE, National Institute of technology, Agartala

نشانی اینترنتی http://www.ije.ir/article_72791_b1393dbe2069cdcc9bc0b6a1e949b92d.pdf
فایل مقاله اشکال در دسترسی به فایل - ./files/site1/rds_journals/409/article-409-2062244.pdf
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زبان مقاله منتشر شده en
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